Dr. Bo-Ching He
at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 16, 2014
Proc. SPIE. 9236, Scanning Microscopies 2014
KEYWORDS: Gold, Mica, Metrology, Data modeling, Calibration, Nanoparticles, Particles, Nitrogen, Atomic force microscopy, Standards development

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