Bo-Yan Lai
at National Chiao Tung Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Hyperspectral imaging, Infrared imaging, Short wave infrared radiation, Spectrographs, Visible radiation, Imaging systems, Reflectivity, Multispectral imaging, Data acquisition, Charge-coupled devices

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