Dr. Bo Yang
Research Engineer at GE Global Research
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 August 2008
Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI
KEYWORDS: Clouds, 3D metrology, Binary data, Inspection, Computer aided design, Digital filtering, Metrology, Solid modeling, Optical spheres, Structured light

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