Prof. Bongtae Han
Professor at Univ of Maryland College Park
SPIE Involvement:
Author
Publications (8)

SPIE Journal Paper | 1 October 2009
JM3 Vol. 8 Issue 04
KEYWORDS: Diffusion, Polymers, Microelectromechanical systems, In situ metrology, Optical testing, Fringe analysis, Calibration, Helium, Interferometry, Finite element methods

Proceedings Article | 9 February 2009 Paper
Proc. SPIE. 7206, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
KEYWORDS: Microelectromechanical systems, Data modeling, Spectroscopy, Error analysis, Molecules, Diffusion, Inspection, Palladium, Analytical research, Helium

Proceedings Article | 9 February 2009 Paper
Proc. SPIE. 7206, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
KEYWORDS: Microelectromechanical systems, Fringe analysis, Calibration, Polymers, Diffusion, Interferometry, Oxygen, Optical testing, Helium, Temperature metrology

SPIE Journal Paper | 1 February 2005
OE Vol. 44 Issue 02
KEYWORDS: Cameras, Diffraction, Fringe analysis, Diffraction gratings, Optical engineering, Moire patterns, Distance measurement, Light sources, Ronchi rulings, Imaging systems

SPIE Journal Paper | 1 April 2004
OE Vol. 43 Issue 04
KEYWORDS: Diffraction, Wavefronts, Interferometry, Interferometers, Infrared radiation, Diffraction gratings, Visible radiation, Surface roughness, Reflectivity, Infrared lasers

Showing 5 of 8 publications
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