Prof. Boon S. Ooi
Professor of Electrical Engineering at King Abdullah Univ of Science and Technology
SPIE Involvement:
| Fellow status | Journal Editorial Board Member | Author
Publications (51)

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10532, Gallium Nitride Materials and Devices XIII
KEYWORDS: Quantum wells, Light emitting diodes, Modulation, Photons, Semiconductor lasers, Gallium nitride, Telecommunications, Light sources and illumination, Data communications, RGB color model

SPIE Journal Paper | June 30, 2017
JNP Vol. 11 Issue 02
KEYWORDS: Heterojunctions, Scanning transmission electron microscopy, Indium gallium nitride, Temperature metrology, Nanowires

PROCEEDINGS ARTICLE | February 16, 2017
Proc. SPIE. 10104, Gallium Nitride Materials and Devices XII
KEYWORDS: Light emitting diodes, Solid state lighting, Silicon, Semiconductor lasers, Light sources and illumination, YAG lasers, Indium gallium nitride, Cerium, RGB color model, Nanowires

PROCEEDINGS ARTICLE | February 16, 2017
Proc. SPIE. 10104, Gallium Nitride Materials and Devices XII
KEYWORDS: Transmitters, Visible radiation, Light sources, Quantum wells, Light emitting diodes, Modulation, Waveguides, Solid state lighting, Semiconductor lasers, Gallium nitride, Superluminescent diodes, Indium gallium nitride

SPIE Journal Paper | July 28, 2016
JNP Vol. 10 Issue 03
KEYWORDS: Annealing, Aluminum, Quantum wells, Gallium, Solid state lighting, Laser applications, Laser damage threshold, Semiconductor lasers, Gallium arsenide, Quantum efficiency

PROCEEDINGS ARTICLE | April 28, 2016
Proc. SPIE. 9892, Semiconductor Lasers and Laser Dynamics VII
KEYWORDS: Quantum wells, Light emitting diodes, Silica, Annealing, Gallium arsenide, Laser processing, Oxygen, Semiconductor lasers, Optoelectronic devices, Aluminum, Epitaxy, Laser damage threshold, Indium gallium phosphide, Sustainable technology

Showing 5 of 51 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top