Mr. Boqun Li
at Shenzhen Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 1, 2014
Proc. SPIE. 9132, Optical Micro- and Nanometrology V
KEYWORDS: Metrology, 3D image reconstruction, Imaging systems, Cameras, Data storage, Stereoscopy, 3D metrology, Computer networks, Computer security, 3D image processing

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