Boris V. Fine
at MPI f Physik Komplexer Systeme
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 9, 2003
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Amorphous silicon, Thin films, Mirrors, Complex systems, Resistance, Physics, Silicon films, Plasma enhanced chemical vapor deposition, Systems modeling, Device simulation

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