Bowen Sheng
at Otto-von-Guericke Univ Magdeburg
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 March 2019
Proc. SPIE. 10918, Gallium Nitride Materials and Devices XIV
KEYWORDS: Luminescence, Indium, Atomic force microscopy, Scanning electron microscopy, Gallium nitride, Optoelectronic devices, Atomic force microscope, Indium gallium nitride

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