Boyi Bin
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 December 2018 Paper
Xinjun Wan, Boyi Bin, Shuping Xie, Song Lv, Songlin Zhuang
Proceedings Volume 10847, 1084710 (2018) https://doi.org/10.1117/12.2505705
KEYWORDS: Freeform optics, Optical testing, LCDs, Deflectometry, 3D image processing, 3D metrology, Image processing, Phase measurement, System integration, Control systems

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top