Richard Brad Brumfield
Manager, Advanced Programs/ QA at Sig Sauer
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 22, 2003
Proc. SPIE. 5180, Optical Manufacturing and Testing V
KEYWORDS: Monochromatic aberrations, Metrology, Interferometers, Sensors, Calibration, Interferometry, Wavefronts, Optical testing, Ray tracing, Contact lenses

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