Dr. Bradley N. Damazo
Mechanical Engineer at National Institute of Standards and Technology
SPIE Involvement:
Publications (7)

Proceedings Article | 2 December 2014 Open Access Paper
Michael Postek, Mary Satterfield, Bradley Damazo, Robert Gordon
Proceedings Volume 8378, 837817 (2014) https://doi.org/10.1117/12.2183085
KEYWORDS: Scanning transmission electron microscopy, Microscopy, Scanning electron microscopy, Mathematics, Electron microscopes, Photomicroscopy, Nanotechnology, Microscopes, Outreach programs, Standards development

Proceedings Article | 6 April 2012 Paper
Bradley Damazo, Ravikiran Attota, Purushotham Kavuri, András Vladár
Proceedings Volume 8324, 832436 (2012) https://doi.org/10.1117/12.918263
KEYWORDS: Nanoparticles, Particles, Gold, Scanning electron microscopy, Optical microscopes, Silicon, Optical microscopy, Calibration, Image processing, Quartz

Proceedings Article | 24 May 2004 Paper
András Vladar, Eranga Jayewardene, Bradley Damazo, William Keery, Michael Postek
Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.562367
KEYWORDS: Scanning electron microscopy, Image resolution, Image enhancement, Electron beams, Resolution enhancement technologies, Line scan image sensors, Interferometers, Standards development, Electron microscopes, Electronics

Proceedings Article | 24 May 2004 Paper
Bradley Damazo, Eranga Jayewardene, Andras Vladar, William Keery, Michael Postek
Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.537502
KEYWORDS: Scanning electron microscopy, Interferometers, Metrology, Control systems, Calibration, Motion measurement, Electron beams, Control systems design, Standards development, Laser systems engineering

SPIE Journal Paper | 1 January 2004
Richard Silver, H. Zou, Satoshi Gonda, Bradley Damazo, Jau-Shi Jun, Carsten Jensen, Lowell Howard
OE, Vol. 43, Issue 01, (January 2004) https://doi.org/10.1117/12.10.1117/1.1631002
KEYWORDS: Semiconductor lasers, Scanning tunneling microscopy, Interferometers, Mirrors, Data acquisition, Tunable diode lasers, Polarization, Motion measurement, Crystals, Distance measurement

Showing 5 of 7 publications
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