Dr. Bradley N. Damazo
Mechanical Engineer at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 2 December 2014 Paper
Proc. SPIE. 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Nanotechnology, Microscopes, Microscopy, Electron microscopes, Scanning electron microscopy, Mathematics, Outreach programs, Photomicroscopy, Scanning transmission electron microscopy, Standards development

Proceedings Article | 6 April 2012 Paper
Proc. SPIE. 8324, Metrology, Inspection, and Process Control for Microlithography XXVI
KEYWORDS: Gold, Optical microscopes, Calibration, Nanoparticles, Quartz, Image processing, Particles, Silicon, Optical microscopy, Scanning electron microscopy

Proceedings Article | 24 May 2004 Paper
Proc. SPIE. 5375, Metrology, Inspection, and Process Control for Microlithography XVIII
KEYWORDS: Electron beams, Metrology, Interferometers, Calibration, Control systems, Scanning electron microscopy, Motion measurement, Control systems design, Standards development, Laser systems engineering

Proceedings Article | 24 May 2004 Paper
Proc. SPIE. 5375, Metrology, Inspection, and Process Control for Microlithography XVIII
KEYWORDS: Electron beams, Electronics, Interferometers, Image resolution, Electron microscopes, Scanning electron microscopy, Image enhancement, Standards development, Resolution enhancement technologies, Line scan image sensors

SPIE Journal Paper | 1 January 2004
OE Vol. 43 Issue 01
KEYWORDS: Semiconductor lasers, Scanning tunneling microscopy, Interferometers, Mirrors, Data acquisition, Tunable diode lasers, Polarization, Motion measurement, Crystals, Distance measurement

Showing 5 of 7 publications
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