Brahim Mezghani
at Ecole Nationale d'Ingénieurs de Sfax
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 June 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Signal to noise ratio, CMOS sensors, Electronics, Sensors, Etching, Interference (communication), Scanning probe lithography, Acoustics, Signal detection, Protactinium

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