Brian Ashe
Program Manager at MKS Instruments Inc
SPIE Involvement:
Publications (7)

Proceedings Article | 17 July 2010 Paper
Danijel Maricic, Zeljko Ignjatovic, Donald Figer, Brian Ashe, Brandon Hanold, Thomas Montagliano, Don Stauffer, Shouleh Nikzad
Proceedings Volume 7742, 774217 (2010)
KEYWORDS: Image sensors, Photodiodes, Transistors, Cadmium sulfide, CMOS sensors, Prototyping, Signal to noise ratio, Astronomical imaging, Sensors, Imaging systems

Proceedings Article | 16 July 2010 Paper
Brandon Hanold, Donald Figer, Brian Ashe, Thomas Montagliano, Donald Stauffer, Zeljko Ignjatovic, Danijel Maricic, Shouleh Nikzad, Todd Jones
Proceedings Volume 7742, 77420A (2010)
KEYWORDS: Sensors, Photodiodes, Capacitance, Quantum efficiency, Analog electronics, CMOS sensors, Electronics, Silicon, Modulation, Etching

Proceedings Article | 13 July 2010 Paper
K. Kolb, N. Stoffel, B. Douglas, C. Maloney, A. Raisanen, B. Ashe, D. Figer, T. Tamagawa, B. Halpern, Zeljko Ignjatovic
Proceedings Volume 7742, 77420C (2010)
KEYWORDS: Metals, Polymers, Indium, Sensors, Photodiodes, Readout integrated circuits, Photoresist processing, Etching, Semiconducting wafers, CMOS sensors

Proceedings Article | 29 August 2008 Paper
B. Ashe, K. Marshall, D. Mastrosimone, C. McAtee
Proceedings Volume 7069, 706902 (2008)
KEYWORDS: Diffraction gratings, Laser damage threshold, Contamination, Ultrasonics, Picosecond phenomena, Spectroscopy, Laser systems engineering, Diffraction, Dielectrics, Pulsed laser operation

Proceedings Article | 20 December 2007 Paper
B. Ashe, C. Giacofei, G. Myhre, A. Schmid
Proceedings Volume 6720, 67200N (2007)
KEYWORDS: Diffraction gratings, Laser damage threshold, Photoresist materials, Scanning electron microscopy, Picosecond phenomena, Ions, Statistical analysis, Fusion energy, Contamination, Laser systems engineering

Showing 5 of 7 publications
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