Brian K. Blakkolb
at Jet Propulsion Lab
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 8 September 2010 Paper
Proc. SPIE. 7794, Optical System Contamination: Effects, Measurements, and Control 2010
KEYWORDS: Carbon, Environmental monitoring, Contamination, Fluctuations and noise, Particles, Gases, Buildings, Semiconducting wafers, Failure analysis, Atmospheric particles

Proceedings Article | 2 September 2008 Paper
Proc. SPIE. 7069, Optical System Contamination: Effects, Measurements, and Control 2008
KEYWORDS: Carbon dioxide, Contamination, Molecules, Diffusion, Turbulence, Solids, Mars, Atmospheric sensing, Atmospheric sciences, Systems modeling

Proceedings Article | 24 February 2003 Paper
Proc. SPIE. 4854, Future EUV/UV and Visible Space Astrophysics Missions and Instrumentation
KEYWORDS: Telescopes, Electronics, Sensors, Satellites, Spectroscopy, Ultraviolet radiation, Imaging spectroscopy, Space telescopes, Space operations, Galactic astronomy

Proceedings Article | 27 October 1998 Paper
Proc. SPIE. 3427, Optical Systems Contamination and Degradation
KEYWORDS: Optical fibers, Image processing, Particles, Silicon, Image analysis, Scanning electron microscopy, Digital imaging, Semiconducting wafers, Binary data, Picture Archiving and Communication System

Proceedings Article | 27 October 1998 Paper
Proc. SPIE. 3427, Optical Systems Contamination and Degradation
KEYWORDS: Contamination, Data modeling, Image processing, Scanners, Particles, Silicon, Scanning electron microscopy, Space operations, Semiconducting wafers, Contamination control

Showing 5 of 6 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top