Dr. Brian D. Hoskins
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 August 2019
Proc. SPIE. 10958, Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019
KEYWORDS: Lithography, Manufacturing, Computing systems, Machine learning, Directed self assembly, Artificial intelligence, Computer architecture, Tolerancing, Nanofabrication, Nanolithography

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