Brian J. Ritter
at Advanced Optical Technologies
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 March 2019
Proc. SPIE. 10750, Reflection, Scattering, and Diffraction from Surfaces VI
KEYWORDS: Polishing, Titanium, Metals, Microscopy, Crystals, Surface roughness, Polarimetry, Spatial resolution, Crystallography, Surface finishing

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