Dr. Brian D. Yanoff
Principal Scientist at GE Research
SPIE Involvement:
Publications (4)

Proceedings Article | 7 April 2023 Presentation + Paper
Proceedings Volume 12463, 124630H (2023) https://doi.org/10.1117/12.2653872
KEYWORDS: Polarization, Electric fields, Electrons, Distortion, Electrodes, Monte Carlo methods, Modeling, X-ray computed tomography, Photon transport, Photodetectors

Proceedings Article | 5 March 2021 Presentation + Paper
Brian Yanoff, Sharon Shwartz, Eliahu Cohen, Vasil Bogdan Neculaes, Uwe Wiedmann, Jonathan Owens, Loucas Tsakalakos
Proceedings Volume 11700, 117003H (2021) https://doi.org/10.1117/12.2586972
KEYWORDS: X-rays, X-ray imaging, Nondestructive evaluation

Proceedings Article | 5 May 2009 Paper
Brian Yanoff, Yanfeng Du, Walter Dixon, Naresh Rao, Wen Li, Bernhard Claus, Terry Topka, Branden Moore, Jeffrey Gordon
Proceedings Volume 7306, 730616 (2009) https://doi.org/10.1117/12.820886
KEYWORDS: Sensors, Personal digital assistants, Gamma radiation, Global Positioning System, Field programmable gate arrays, Crystals, Calibration, Imaging systems, Signal detection, Data communications

Proceedings Article | 24 September 2007 Paper
Yanfeng Du, Wen Li, Brian Yanoff, Jeffrey Gordon, Donald Castleberry
Proceedings Volume 6706, 67060V (2007) https://doi.org/10.1117/12.739073
KEYWORDS: Sensors, Imaging systems, Detection and tracking algorithms, Image resolution, Reconstruction algorithms, Spatial resolution, Gamma radiation, 3D image processing, Image restoration, 3D surface sensing

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