Dr. Brian W. Yates
Staff Scientist at Canadian Light Source Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (5)

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Gold, Mirrors, Photon polarization, Polarization, Reflectivity, Wave plates, Polarimetry

Proceedings Article | 15 October 2012 Paper
Proc. SPIE. 8501, Advances in Metrology for X-Ray and EUV Optics IV
KEYWORDS: Mirrors, MATLAB, X-ray optics, Metrology, Error analysis, X-rays, Surface roughness, Optical metrology, 3D metrology, Standards development

Proceedings Article | 23 September 2011 Paper
Proc. SPIE. 8141, Advances in Computational Methods for X-Ray Optics II
KEYWORDS: Optical components, Mirrors, Kinematics, 3D modeling, Ray tracing, Computer aided design, Motion models, Mirror mounts, Systems modeling, Solid modeling

Proceedings Article | 27 August 2010 Paper
Proc. SPIE. 7802, Advances in X-Ray/EUV Optics and Components V
KEYWORDS: Mirrors, Crystals, Interfaces, Indium, Silicon, Photonic crystals, Finite element methods, Synchrotrons, Laser crystals, Monochromators

Proceedings Article | 3 September 2008 Paper
Proc. SPIE. 7077, Advances in X-Ray/EUV Optics and Components III
KEYWORDS: Mirrors, Metrology, Statistical analysis, Spatial frequencies, Glasses, Ultraviolet radiation, Error analysis, Surface roughness, Profilometers, Tin

Conference Committee Involvement (22)
Advances in X-Ray/EUV Optics and Components XVI
1 August 2021 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XV
26 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in X-Ray/EUV Optics and Components XIV
14 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Showing 5 of 22 Conference Committees
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