Dr. Brock Alexander Profile

Dr. Brock Alexander

Manager at 5N Plus Semiconductors LLC

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 23 May 2018 Paper

Interface engineering in InSb crystal growth for focal plane array device performance

Nathan Gray, Andrew Prax, W. Brock Alexander, Jason Merrell

Proceedings Volume 10624, 106241U (2018) https://doi.org/10.1117/12.2305239

KEYWORDS: Crystals, Interfaces, Semiconducting wafers, Staring arrays, Solids, Chemical species, Supercooling, Manufacturing

Read Abstract +

Proceedings Article | 29 September 2017 Presentation + Paper

Measuring Te inclusion uniformity over large areas for CdTe/CZT imaging and spectrometry sensors

Joe Bolke, Kathryn O'Brien, Peter Wall, Mike Spicer, Guillaume Gélinas, Jean-Nicolas Beaudry, W. Brock Alexander

Proceedings Volume 10423, 104231M (2017) https://doi.org/10.1117/12.2278584

KEYWORDS: Crystals, Sensors, Imaging spectroscopy, Spectroscopy, Image sensors, Spectroscopes, Optical sensors, X-ray imaging, X-rays, Astrophysics

Read Abstract +

Proceedings Article | 20 May 2016 Paper

Rapid development of high-volume manufacturing methods for epi-ready GaSb wafers up to 6” diameter for IR imaging applications

Nathan Gray, Andrew Prax, Daniel Johnson, Jonathan Demke, Joseph Bolke, W. Alexander

Proceedings Volume 9819, 981914 (2016) https://doi.org/10.1117/12.2223998

KEYWORDS: Gallium antimonide, Semiconducting wafers, Crystals, Superlattices, Infrared imaging, X-rays, Antimony, Manufacturing, Wafer manufacturing, Interfaces

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years