Prof. Bruce G. Batchelor
at Cardiff Univ
SPIE Involvement:
Fellow status | Symposium Committee | Conference Chair | Conference Program Committee | Author | Editor
Publications (78)

PROCEEDINGS ARTICLE | November 17, 2005
Proc. SPIE. 5999, Intelligent Systems in Design and Manufacturing VI
KEYWORDS: MATLAB, Cameras, Databases, Image processing, Computing systems, Control systems, Computer programming, Machine vision, Java, Intelligence systems

PROCEEDINGS ARTICLE | November 7, 2005
Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III
KEYWORDS: Internet, MATLAB, Imaging systems, Cameras, Image processing, Inspection, Control systems, Light sources and illumination, Machine vision, Prototyping

PROCEEDINGS ARTICLE | October 25, 2004
Proc. SPIE. 5608, Intelligent Robots and Computer Vision XXII: Algorithms, Techniques, and Active Vision
KEYWORDS: Genetic algorithms, Detection and tracking algorithms, Image processing, Hough transforms, Quantization, Light sources and illumination, Machine vision, Tolerancing, Binary data, Blob detection

PROCEEDINGS ARTICLE | February 26, 2004
Proc. SPIE. 5265, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
KEYWORDS: Internet, Image compression, Visualization, Cameras, Databases, Image processing, Control systems, Image analysis, Distributed computing, 3D image processing

PROCEEDINGS ARTICLE | February 26, 2004
Proc. SPIE. 5265, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
KEYWORDS: Internet, Human-machine interfaces, Cameras, Databases, Image processing, Control systems, Light sources and illumination, Machine vision, Java, Prototyping

Showing 5 of 78 publications
Conference Committee Involvement (17)
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
29 October 2003 | Providence, RI, United States
Intelligent Robots and Computer Vision XXI: Algorithms, Techniques, and Active Vision
28 October 2003 | Providence, RI, United States
Photonics Technologies for Robotics, Automation, and Manufacturing
27 October 2003 | Providence, United States
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology
7 November 2000 | Boston, MA, United States
Machine Vision Systems for Inspection and Metrology VIII
21 September 1999 | Boston, MA, United States
Showing 5 of 17 published special sections
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