Proc. SPIE. 11114, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI
KEYWORDS: Logic, Data modeling, Imaging systems, Cameras, Sensors, Diagnostics, Power supplies, Field programmable gate arrays, X-ray imaging, National Ignition Facility
The National Ignition Facility’s (NIF) high-yield DT shots create a harsh radiation environment that can cause electronics to malfunction. This paper documents various design tradeoffs and techniques used for a Microsemi FPGA to reduce the impact of Single Event Upsets (SEUs) that enable a camera to capture images in the NIF target chamber during a high-yield shot.
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