Bruce E. Johnson
Senior Director of Marketing/Business Development at Media Lario Srl
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 March 2010
Proc. SPIE. 7636, Extreme Ultraviolet (EUV) Lithography
KEYWORDS: Mirrors, Reflectivity, Plasma, Optics manufacturing, Extreme ultraviolet, Thermography, Grazing incidence, Manufacturing, EUV optics, Optical design

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