Mr. Bruce D. MacLeod
Microlithography Engineer at TelAztec LLC
SPIE Involvement:
Author
Publications (11)

PROCEEDINGS ARTICLE | November 23, 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Thin films, Antireflective coatings, Continuous wave operation, Silica, Laser induced damage, Laser damage threshold, YAG lasers, Nanophotonics, Thin film coatings, Photonic microstructures, Absorption

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Nanotechnology, Reflectors, Thin films, Silica, Reflection, Laser induced damage, Laser damage threshold, Prototyping, Photonic microstructures, Absorption

PROCEEDINGS ARTICLE | November 14, 2013
Proc. SPIE. 8885, Laser-Induced Damage in Optical Materials: 2013
KEYWORDS: Antireflective coatings, Silica, Etching, Laser induced damage, Coating, Resistance, Adsorption, Laser damage threshold, Sol-gels, National Ignition Facility

PROCEEDINGS ARTICLE | December 4, 2012
Proc. SPIE. 8530, Laser-Induced Damage in Optical Materials: 2012
KEYWORDS: Mid-IR, Polishing, Continuous wave operation, Etching, Laser induced damage, Zinc, Chromium, Laser damage threshold, Reactive ion etching, Surface finishing

PROCEEDINGS ARTICLE | December 4, 2012
Proc. SPIE. 8530, Laser-Induced Damage in Optical Materials: 2012
KEYWORDS: Thin films, Polishing, Silica, Reflection, Glasses, Laser induced damage, Nd:YAG lasers, Sapphire, Laser damage threshold, Spinel

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8016, Window and Dome Technologies and Materials XII
KEYWORDS: Mid-IR, Thin films, Diamond, Glasses, Laser induced damage, Nickel, Gallium arsenide, Silicon, Scanning electron microscopy, ZBLAN

Showing 5 of 11 publications
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