Bruce D. MacLeod
Microlithography Engineer at TelAztec LLC
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 16 November 2018
Proc. SPIE. 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference
KEYWORDS: Refractive index, Magnesium fluoride, Silica, Reflection, Laser induced damage, Tantalum, Absorption

Proceedings Article | 23 November 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Thin films, Antireflective coatings, Continuous wave operation, Silica, Laser induced damage, Laser damage threshold, YAG lasers, Nanophotonics, Thin film coatings, Photonic microstructures, Absorption

Proceedings Article | 21 November 2017
Proc. SPIE. 10447, Laser-Induced Damage in Optical Materials 2017
KEYWORDS: Nanotechnology, Reflectors, Thin films, Silica, Reflection, Laser induced damage, Laser damage threshold, Prototyping, Photonic microstructures, Absorption

Proceedings Article | 14 November 2013
Proc. SPIE. 8885, Laser-Induced Damage in Optical Materials: 2013
KEYWORDS: Antireflective coatings, Silica, Etching, Laser induced damage, Coating, Resistance, Adsorption, Laser damage threshold, Sol-gels, National Ignition Facility

Proceedings Article | 4 December 2012
Proc. SPIE. 8530, Laser-Induced Damage in Optical Materials: 2012
KEYWORDS: Mid-IR, Polishing, Continuous wave operation, Etching, Laser induced damage, Zinc, Chromium, Laser damage threshold, Reactive ion etching, Surface finishing

Showing 5 of 12 publications
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