Bruno Huysmans
at Univ Gent
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 2 October 2007
Proc. SPIE. 6763, Wavelet Applications in Industrial Processing V
KEYWORDS: Signal to noise ratio, Image fusion, Wavelet transforms, Data modeling, Wavelets, Denoising, Remote sensing, Image filtering, Statistical modeling, Global system for mobile communications

Proceedings Article | 8 November 2005
Proc. SPIE. 6001, Wavelet Applications in Industrial Processing III
KEYWORDS: Edge detection, Wavelet transforms, Visualization, Signal attenuation, Wavelets, Denoising, Image quality, Image classification, Image denoising, Algorithm development

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