Bryan L. Holtsberry
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 21 April 2020
Proc. SPIE. 11412, Polarization: Measurement, Analysis, and Remote Sensing XIV
KEYWORDS: Long wavelength infrared, Mid-IR, Refractive index, Diffuse reflectance spectroscopy, Metals, Remote sensing, Dielectrics, Reflectivity, Polarimetry, Dielectric polarization

Proceedings Article | 21 April 2020
Proc. SPIE. 11412, Polarization: Measurement, Analysis, and Remote Sensing XIV
KEYWORDS: Long wavelength infrared, Infrared imaging, Mid-IR, Polarization, Imaging systems, LIDAR, Sensors, Calibration, Reflectivity, Polarimetry

Proceedings Article | 6 September 2019
Proc. SPIE. 11132, Polarization Science and Remote Sensing IX
KEYWORDS: Long wavelength infrared, Mid-IR, Refractive index, Mica, Data modeling, Imaging systems, Remote sensing, Polarimetry, Refraction, Aluminum

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