Dr. Burkhard Neinhues
at Technische Univ Braunschweig
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Germanium, Electrons, Diffusion, Doping, Computer simulations, Monte Carlo methods, Solids, Molybdenum, Performance modeling, Instrument modeling

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Scattering, Germanium, Resistance, Computer simulations, Monte Carlo methods, Bismuth, Thermal modeling, Device simulation, Instrument modeling, Accuracy assessment

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