Byoung-Uck Choo
at Samyang Optics Co Ltd
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | November 24, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Photovoltaics, Telescopes, Mirrors, Interferometers, Sensors, 3D metrology, Profilometers, Aspheric lenses, Data centers, Mechanical engineering

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Ferroelectric materials, Coherence (optics), Interferometers, Sensors, Interferometry, Wavefronts, Distance measurement, 3D metrology, Objectives, Aspheric lenses

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