Byungsool Moon
Graduate Student at Portland State Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 17 May 2005 Paper
James McNames, Byungsool Moon, Bruce Whitefield, David Abercrombie
Proceedings Volume 5755, (2005) https://doi.org/10.1117/12.600198
KEYWORDS: Semiconducting wafers, Reticles, Data modeling, Optimization (mathematics), Statistical analysis, Photomasks, Optical lithography, Etching, Semiconductor manufacturing, Process modeling

Proceedings Article | 17 May 2005 Paper
Byungsool Moon, James McNames, Bruce Whitefield, Paul Rudolph, Jeff Zola
Proceedings Volume 5755, (2005) https://doi.org/10.1117/12.600217
KEYWORDS: Semiconducting wafers, Monte Carlo methods, Inspection, Detection and tracking algorithms, Signal to noise ratio, Manufacturing, Algorithm development, Statistical analysis, Sensors, Semiconductor manufacturing

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