Dr. Zewei Cai
Postdoctoral fellow at Shenzhen Univ
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Metrology, Microlens array, Cameras, Sensors, Calibration, Image processing, Optical testing, Image sensors, Signal detection, 3D image processing

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Modulation, Imaging systems, Cameras, Calibration, Computer programming, 3D modeling, 3D metrology, Microlens, 3D image processing, Phase shifts

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: 3D image reconstruction, Imaging systems, Cameras, Calibration, 3D metrology

Proceedings Article | 7 September 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Point spread functions, Scattering, Image processing, Light scattering, Image restoration, Deconvolution

Proceedings Article | 7 September 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Optical transfer functions, Imaging systems, Spatial frequencies, Scattering media

Showing 5 of 10 publications
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