Dr. Cai-hong Dai
at National Institute of Metrology
SPIE Involvement:
Author
Publications (28)

Proceedings Article | 17 April 2020
Proc. SPIE. 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications
KEYWORDS: Metrology, Lithium, Calibration, Ultraviolet radiation, Spectral calibration, Black bodies, Thermometry, Radiometry, Lutetium, Temperature metrology

Proceedings Article | 31 January 2020
Proc. SPIE. 11427, Second Target Recognition and Artificial Intelligence Summit Forum

Proceedings Article | 18 December 2019
Proc. SPIE. 11337, AOPC 2019: Optical Spectroscopy and Imaging
KEYWORDS: FT-IR spectroscopy, Infrared radiation, Optical simulations

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: FT-IR spectroscopy, Optical metrology, Infrared radiation, Radiometry

Proceedings Article | 12 March 2019
Proc. SPIE. 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application
KEYWORDS: Light sources, Metrology, Radio optics, Computer programming, Colorimetry, Black bodies, Radiometry, CIE 1931 color space, Temperature metrology, Light

Showing 5 of 28 publications
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