Dr. Cameron M. Kewish
Research Fellow at Australian Synchrotron
SPIE Involvement:
Conference Program Committee | Author
Publications (10)

PROCEEDINGS ARTICLE | September 26, 2013
Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods
KEYWORDS: Actuators, Diffraction, Lenses, X-rays, Scanning electron microscopy, Optical alignment, Zone plates, Binary data, Phase shifts, Near field optics

PROCEEDINGS ARTICLE | September 26, 2013
Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods
KEYWORDS: Coherence imaging, Mirrors, Mechanics, Imaging systems, X-rays, Nanoprobes, Synchrotrons, Spatial resolution, Monochromators, X-ray imaging

PROCEEDINGS ARTICLE | September 26, 2013
Proc. SPIE. 8851, X-Ray Nanoimaging: Instruments and Methods
KEYWORDS: Diffraction, Point spread functions, Mirrors, X-ray optics, Metrology, X-rays, Reflectivity, Nanoprobes, Tolerancing, Hard x-rays

PROCEEDINGS ARTICLE | September 28, 2011
Proc. SPIE. 8139, Advances in X-Ray/EUV Optics and Components VI
KEYWORDS: Electron beam lithography, Coherence imaging, X-ray optics, X-rays, X-ray diffraction, Reconstruction algorithms, Spatial resolution, Zone plates, Hard x-rays, Iridium

PROCEEDINGS ARTICLE | May 13, 2010
Proc. SPIE. 7716, Micro-Optics 2010
KEYWORDS: Prisms, X-ray optics, Lenses, Polymers, X-rays, X-ray microscopy, X-ray imaging, X-ray lithography, Photorefractive polymers, Synchrotron technology

PROCEEDINGS ARTICLE | May 22, 2009
Proc. SPIE. 7378, Scanning Microscopy 2009
KEYWORDS: Coherence imaging, Phase contrast, Scattering, Sensors, Microscopy, X-rays, X-ray microscopy, Light scattering, X-ray imaging, Optics manufacturing

Showing 5 of 10 publications
Conference Committee Involvement (1)
Advances in Computational Methods for X-Ray Optics II
21 August 2011 | San Diego, California, United States
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