Cameron J. Shearer
at Flinders Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | December 30, 2008
Proc. SPIE. 7267, Smart Materials V
KEYWORDS: Confocal microscopy, FT-IR spectroscopy, Etching, Silicon, Nitrogen, Atomic force microscopy, Raman spectroscopy, Ozone, Semiconducting wafers, Carbon nanotubes

PROCEEDINGS ARTICLE | December 30, 2008
Proc. SPIE. 7267, Smart Materials V
KEYWORDS: Carbon, FT-IR spectroscopy, Magnesium, Nanostructuring, Polymers, Spectroscopy, Nitrogen, Atomic force microscopy, Solids, Carbon nanotubes

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