Carlos Alberto Galván-Hernández
Nanoscience and Nanotechnology Researcher at Ctr Nacional de Metrologia
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 November 2003
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Microscopes, Refractive index, Interferometers, Calibration, Image processing, Interferometry, Control systems, CCD cameras, Software development, Image filtering

Proceedings Article | 29 July 2002
Proc. SPIE. 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
KEYWORDS: Fringe analysis, Edge detection, Metrology, Data modeling, Interferometers, Calibration, Error analysis, Interferometry, Laser metrology, Standards development

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top