Carmen Maya
at Univ Politècnica de Catalunya
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Calibration, Error analysis, Gallium arsenide, Resistance, Receivers, Measurement devices, Bismuth, Microwave radiation, Instrument modeling, Received signal strength

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Roentgenium, Calibration, Receivers, Diodes, Measurement devices, Field effect transistors, Avalanche photodiodes, Neodymium, Microwave radiation, Temperature metrology

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