Prof. Carmine Ciofi Profile

Prof. Carmine Ciofi

at Univ degli Studi di Messina

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 11 June 2007 Paper

Four channels cross correlation method for high sensitivity current noise measurements

C. Ciofi, G. Scandurra, R. Merlino, G. Cannatà, G. Giusi

Proceedings Volume 6600, 660012 (2007) https://doi.org/10.1117/12.725528

KEYWORDS: Amplifiers, Resistance, Interference (communication), Selenium, Resistors, Capacitors, Field effect transistors, Capacitance, Spectrum analysis, Linear filtering

Read Abstract +

Proceedings Article | 8 June 2007 Paper

A very low noise voltage reference for high sensitivity noise measurements

C. Ciofi, G. Cannatà, G. Scandurra, R. Merlino

Proceedings Volume 6600, 66000K (2007) https://doi.org/10.1117/12.725522

KEYWORDS: Diodes, Resistance, Solid state physics, Temperature metrology, Remote sensing, Transistors, Interference (communication), Control systems, Signal attenuation, Amplifiers

Read Abstract +

Proceedings Article | 25 May 2004 Paper

Long term stability estimation of DC electrical sources from low frequency noise measurements

Carmine Ciofi, Gino Giusi, Calogero Pace

Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.547137

KEYWORDS: Amplifiers, Optical filters, Time metrology, Electronic filtering, Data acquisition, Superposition, Sinc filters, Light emitting diodes, Solid state physics, Spectrum analysis

Read Abstract +

Proceedings Article | 12 May 2003 Paper

Low-frequency noise measurements: applications, methodologies and instrumentation

Carmine Ciofi, Bruno Neri

Proceedings Volume 5113, (2003) https://doi.org/10.1117/12.489652

KEYWORDS: Amplifiers, Resistance, Field effect transistors, Interference (communication), Resistors, Reliability, Oxides, Power supplies, Signal detection, Data acquisition

Read Abstract +

Proceedings Volume Editor (1)

SPIE Conference Volume | 7 June 2007

Noise and Fluctuations in Circuits, Devices, and Materials

Conference Committee Involvement (4)

Noise and Fluctuations in Circuits, Devices, and Materials

21 May 2007 | Florence, Italy

Noise in Devices and Circuits III

24 May 2005 | Austin, Texas, United States

Noise in Devices and Circuits II

26 May 2004 | Maspalomas, Gran Canaria Island, Spain

Noise in Devices and Circuits

2 June 2003 | Santa Fe, New Mexico, United States

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years