Dr. Carsten Michaelsen
at Incoatec GmbH
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10387, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI
KEYWORDS: Analytics, Diffraction, Mirrors, Electron beams, X-ray optics, Crystals, X-rays, X-ray diffraction, X-ray sources, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | September 9, 2009
Proc. SPIE. 7448, Advances in X-Ray/EUV Optics and Components IV
KEYWORDS: Scattering, Sensors, X-rays, Copper, X-ray diffraction, X-ray sources, Silver, Laser scattering, Beam shaping, Molybdenum

PROCEEDINGS ARTICLE | September 9, 2009
Proc. SPIE. 7448, Advances in X-Ray/EUV Optics and Components IV
KEYWORDS: Wafer-level optics, Multilayers, X-ray optics, Capillaries, X-rays, X-ray sources, Reflectometry, Beam shaping, Free electron lasers, Optics manufacturing

PROCEEDINGS ARTICLE | May 18, 2007
Proc. SPIE. 6586, Damage to VUV, EUV, and X-ray Optics
KEYWORDS: Carbon, Mirrors, Multilayers, X-ray optics, Reflection, Coating, Reflectivity, Synchrotrons, Free electron lasers, Optics manufacturing

PROCEEDINGS ARTICLE | August 30, 2005
Proc. SPIE. 5917, Fourth Generation X-Ray Sources and Optics III
KEYWORDS: Carbon, Optical components, Mirrors, Optical coatings, Zinc, Atomic force microscopy, Raman spectroscopy, Extreme ultraviolet, Vacuum ultraviolet, Free electron lasers

PROCEEDINGS ARTICLE | November 3, 2004
Proc. SPIE. 5537, X-Ray Sources and Optics
KEYWORDS: Diffraction, Mirrors, X-ray optics, Photons, Crystals, X-rays, Reflectivity, Monochromators, Crystallography, Single crystal X-ray diffraction

Showing 5 of 12 publications
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