Mr. Cary O. Davis Profile

Cary O. Davis

FA Manager at Texas Instruments Inc

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 23 December 2003 Paper

MEMS/MOEMS failure location and characterization methods: the micromirror device

Cary Davis

Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.524104

KEYWORDS: Mirrors, Failure analysis, Digital micromirror devices, Particles, Micromirrors, Microelectromechanical systems, Reflectivity, Scanning electron microscopy, Microopto electromechanical systems, Digital imaging

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years