Cary O. Davis
FA Manager at Texas Instruments Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 23, 2003
Proc. SPIE. 5343, Reliability, Testing, and Characterization of MEMS/MOEMS III
KEYWORDS: Microelectromechanical systems, Mirrors, Particles, Reflectivity, Scanning electron microscopy, Digital imaging, Microopto electromechanical systems, Micromirrors, Digital micromirror devices, Failure analysis

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