Dr. Catherine Burcklen
at Lawrence Livermore National Lab.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 June 2018
Proc. SPIE. 10691, Advances in Optical Thin Films VI
KEYWORDS: Multilayers, Data modeling, X-rays, Interfaces, Silicon, Reflectivity, Silicon carbide, Molybdenum, Systems modeling

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