Cecile S. Barat
at Univ Jean Monnet Saint-Etienne
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 27, 2004
Proc. SPIE. 5266, Wavelet Applications in Industrial Processing
KEYWORDS: Image segmentation, Edge detection, X-rays, X-ray imaging, Wavelet transforms, 3D modeling, Wavelets, Surgery, Reconstruction algorithms, 3D image processing

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