Cecile S. Barat
at Univ Jean Monnet Saint-Etienne
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 27, 2004
Proc. SPIE. 5266, Wavelet Applications in Industrial Processing
KEYWORDS: Edge detection, Wavelet transforms, Surgery, Image segmentation, Wavelets, X-rays, 3D modeling, Reconstruction algorithms, X-ray imaging, 3D image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top