Dr. Cecile Petitdidier
at Commissariat à l'Energie Atomique
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 16 May 2007 Paper
C. Petitdidier, R. Tiron, S. Derrough, C. Sourd, L. Koscianski, B. Mortini
Proceedings Volume 6591, 65910I (2007) https://doi.org/10.1117/12.724202
KEYWORDS: Glasses, Polymethylmethacrylate, Polymers, Temperature metrology, Thin films, Lithography, Silicon films, Polymer thin films, Silicon, Microelectronics

Proceedings Article | 2 April 2007 Paper
R. Tiron, C. Petitdidier, C. Sourd, D. De Simone, G. Cotti, E. Annoni, B. Mortini
Proceedings Volume 6519, 65193A (2007) https://doi.org/10.1117/12.711678
KEYWORDS: Photoresist processing, Temperature metrology, Critical dimension metrology, Polymers, Glasses, Lithography, Optical lithography, Signal attenuation, Resist chemistry, Chemical analysis

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