Cedric Leyris
at Univ Montpellier II
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 May 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oxides, Signal to noise ratio, Switches, Switching, Silicon, Interference (communication), Transistors, Field effect transistors, Molybdenum, Instrument modeling

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