Dr. Cemal Draman
at ENSPS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 17, 2004
Proc. SPIE. 5458, Optical Micro- and Nanometrology in Manufacturing Technology
KEYWORDS: 3D acquisition, Imaging systems, Image processing, Video, Microscopy, Image acquisition, Time metrology, High speed cameras, 3D metrology, 3D image processing

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