Dr. Cemil Kayis
at Virginia Commonwealth Univ
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 27 March 2013 Paper
R. Ferreyra, X. Li, F. Zhang, C. Zhu, N. Izyumskaya, C. Kayis, V. Avrutin, Ü. Özgür, H. Morkoç
Proceedings Volume 8625, 86252B (2013) https://doi.org/10.1117/12.2005165
KEYWORDS: Phonons, Gallium nitride, Microwave radiation, Heterojunctions, Plasmons, Transistors, Aluminum, Aluminum nitride, Lithium, Reliability

Proceedings Article | 4 March 2013 Paper
Proceedings Volume 8625, 86252H (2013) https://doi.org/10.1117/12.2000558
KEYWORDS: Capacitance, Microwave radiation, Fourier transforms, Gallium nitride, Phase measurement, Phonons, Heterojunctions, Field effect transistors, Interfaces, Reliability

Proceedings Article | 28 February 2012 Paper
Proceedings Volume 8262, 826225 (2012) https://doi.org/10.1117/12.903983
KEYWORDS: Field effect transistors, Piezoelectric effects, Gallium nitride, Transistors, Applied physics, Reliability, Phonons, Heterojunctions, Lithium, Molybdenum

Proceedings Article | 28 February 2012 Paper
Proceedings Volume 8262, 82621W (2012) https://doi.org/10.1117/12.908501
KEYWORDS: Phonons, Gallium nitride, Heterojunctions, Transistors, Semiconducting wafers, Phase measurement, Ultrafast phenomena, Astatine, Molybdenum, Ultrafast measurement systems

Proceedings Article | 28 February 2012 Paper
Proceedings Volume 8262, 82621U (2012) https://doi.org/10.1117/12.907515
KEYWORDS: Transistors, Heterojunctions, Gallium nitride, Phase measurement, Reliability, Indium, Measurement devices, Calibration, Semiconducting wafers, Piezoelectric effects

Showing 5 of 8 publications
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