Prof. Cesar A. Sciammarella
Doctor at Illinois Institute of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (22)

SPIE Journal Paper | March 1, 2008
OE Vol. 47 Issue 03
KEYWORDS: Projection systems, Cameras, Stereolithography, Optical engineering, Finite element methods, Computer aided design, Optical testing, Statistical modeling, Calibration, Modulation

SPIE Journal Paper | March 1, 2008
OE Vol. 47 Issue 03
KEYWORDS: Cameras, Projection systems, Optical engineering, Mathematical modeling, Modulation, Imaging systems, Phase shift keying, Optical spheres, Calibration, Image processing

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Moire patterns, Fringe analysis, Holography, Modulation, Fourier transforms, Phase shift keying, CCD cameras, Data processing, Raster graphics, Data analysis

PROCEEDINGS ARTICLE | September 17, 2005
Proc. SPIE. 5914, Wavelets XI
KEYWORDS: Fringe analysis, Wavelet transforms, Modulation, Wavelets, Fourier transforms, Interference (communication), Signal processing, Holographic interferometry, Algorithm development, Continuous wavelet transforms

SPIE Journal Paper | September 1, 2005
OE Vol. 44 Issue 09
KEYWORDS: Teeth, Optical testing, Photogrammetry, Calibration, Cameras, 3D modeling, Optical engineering, Mathematical modeling, Projection systems, Data modeling

SPIE Journal Paper | November 1, 2003
OE Vol. 42 Issue 11
KEYWORDS: Wavelets, Fourier transforms, Fringe analysis, Wavelet transforms, Optical engineering, Signal processing, Chemical species, Spatial frequencies, Interference (communication), Signal analyzers

Showing 5 of 22 publications
Conference Committee Involvement (1)
Laser Interferometry X: Applications
2 August 2000 | San Diego, CA, United States
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