Chang Hyun Park
Instrumentation & Control Team at POSCO
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 22 May 2017
Jong Pil Yun, Dongseob Kim, KyuHwan Kim, Sang Jun Lee, Chang Hyun Park, Sang Woo Kim
OE, Vol. 56, Issue 05, 053108, (May 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.5.053108
KEYWORDS: Defect inspection, Light sources and illumination, Cameras, Image processing, Defect detection, Optical filters, Switching, Visual optics, Detection and tracking algorithms, Computer simulations

SPIE Journal Paper | 1 January 2010
Changhyun Park, Seho Choi, Sangchul Won
OE, Vol. 49, Issue 01, 017202, (January 2010) https://doi.org/10.1117/12.10.1117/1.3284779
KEYWORDS: Inspection, Defect detection, Defect inspection, Detection and tracking algorithms, Algorithm development, Image processing, Discrete wavelet transforms, Signal to noise ratio, Fourier transforms, Optical engineering

Proceedings Article | 15 March 1998 Paper
HaSul Kim, Changhyun Park, Young Shin, Jin Jung
Proceedings Volume 3399, (1998) https://doi.org/10.1117/12.302537
KEYWORDS: Chromium, Phase shifts, Phase shift keying, Image processing, Gaussian filters, 3D image processing, Fringe analysis, Image filtering, Optics manufacturing, Optical filters

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