Dr. Changlin Leng
at Tianjin Univ
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | June 10, 2006
Proc. SPIE. 6344, Advanced Laser Technologies 2005
KEYWORDS: Microelectromechanical systems, Resonators, Doppler effect, Spatial filters, Laser applications, Signal processing, Aspheric lenses, Velocity measurements, Motion measurement, Laser systems engineering

PROCEEDINGS ARTICLE | February 11, 2005
Proc. SPIE. 5625, Optical Transmission, Switching, and Subsystems II
KEYWORDS: Microelectromechanical systems, Resonators, Doppler effect, Resistance, Amplifiers, Linear filtering, Optical testing, Signal generators, Bragg cells, Motion measurement

PROCEEDINGS ARTICLE | February 9, 2005
Proc. SPIE. 5635, Nanophotonics, Nanostructure, and Nanometrology
KEYWORDS: Mirrors, Optical amplifiers, Polarization, Reflection, Calibration, Ceramics, Amplifiers, Optical testing, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | January 27, 2005
Proc. SPIE. 5645, Advanced Microlithography Technologies
KEYWORDS: Microscopes, Mirrors, Surface roughness, CCD cameras, Data processing, 3D metrology, Phase measurement, Radium, Surface finishing, Phase shifts

PROCEEDINGS ARTICLE | January 20, 2005
Proc. SPIE. 5628, Semiconductor Lasers and Applications II
KEYWORDS: Cooling systems, High power lasers, Copper, Laser development, Resistance, Control systems, Semiconductor lasers, Solids, Finite element methods, Laser crystals

PROCEEDINGS ARTICLE | December 30, 2004
Proc. SPIE. 5641, MEMS/MOEMS Technologies and Applications II
KEYWORDS: Microelectromechanical systems, Resonators, Doppler effect, Silicon, Resistance, Amplifiers, Control systems, Laser resonators, Motion measurement, Filtering (signal processing)

Showing 5 of 6 publications
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