Changyong Chen
at Shanghai Jiao Tong Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 September 2006 Paper
Proceedings Volume 6354, 63542N (2006) https://doi.org/10.1117/12.688694
KEYWORDS: Line width roughness, Optical networks, Stochastic processes, Mathematical modeling, Algorithms, Detection and tracking algorithms, Algorithm development, Mathematics, Computer simulations, Computer programming

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